Test and design for test

Submitted by kerckenaere on Mon, 09/22/2008 - 11:45

Attachment	Size
DFT Training.pdf	38.95 KB
Cost Reduction Training.pdf	38.02 KB
Boundary Scan - Demystified.pdf	41.84 KB
0ppm Training.pdf	41.01 KB

Overview of the solution:

The main objectives of the method are to exploit the DFT and ePHM features introduced into the design during the design phase to their full extent in the validation, verification and test phase; and are to improve the test process.

Co-Design Challenges Addressed:

Growing device complexity negatively affects test cost and test execution times. Capabilities made available through the application of a proper DFT methodology and the addition of HW prognostics provisions are not fully exploited.

Additional Information:

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<![endif]-->It is the task of the test expert/consultant to assure that capabilities (made available through the application of a proper DFT methodology and the development of a prognostics based on-line (or start-up related) test methodology enabling continuously monitoring of the fitness of the system and supporting preventive maintenance offered by the hard- and software of the system) are fully exploited.