The objective is the creation of a co-simulation environment for testing an advanced current measurement instrument that makes use of an embedded of-the-shelf MCU. The co-simulation environment is setup using a VHDL IDE and the IDE software of the MCU vendor. The advanced current measurement system is successfully co-simulated with this flow and will be used in product maintenance and customization actions as it offers added value to the traditional MCU design flow in the form of increased product reliability and a systematic work flow for developing customer tailored firmware. The framework significantly decreases firmware design time and significantly improves test quality and product reliability. The simulation environment can also assist in creation and validation of higher level MCU models. The choice of VHDL to create this framework is not a limiting factor as higher level system language support (SystemC, ADA, …) could also be added to this work flow.

see attached report

Position in the Domain

see attachement

Used Methofds and Tools

TE-WP2-QST-1-S1;TE-WP3-QST-1-S1

Experience

• Cost saving was considerable
• Time-to-market was considerablly improved
• Reusability was considerablly improved
• Quality was considerablly improved